@Article{RodriguesJúniorMRRASGPM:2020:PsReRo,
author = "Rodrigues J{\'u}nior, Gilberto and Marcal, Lucas Atila Bernardes
and Ribeiro, Guliherme A. s. and Rappl, Paulo Henrique de Oliveira
and Abramof, Eduardo and Sciammarella, Paulo Vitor and
Guimar{\~a}es, Luciano de Moura and Perez, Carlos Alberto and
Malachias, Angelo",
affiliation = "{Universidade Federal de Minas Gerais (UFMG)} and {Universidade
Federal de Minas Gerais (UFMG)} and {Universidade Federal de Minas
Gerais (UFMG)} and {Instituto Nacional de Pesquisas Espaciais
(INPE)} and {Instituto Nacional de Pesquisas Espaciais (INPE)} and
{Universidade Federal de Vi{\c{c}}osa (UFV)} and {Universidade
Federal de Vi{\c{c}}osa (UFV)} and {Laborat{\'o}rio Nacional de
Luz S{\'{\i}}ncrotron (LNLS)} and {Universidade Federal de Minas
Gerais (UFMG)}",
title = "Direct observation of large strain through van der Waals gaps on
epitaxial Bi2Te3/graphite: Pseudomorphic relaxation and the role
of Bi-2 layers on the BixTey topological insulator series",
journal = "Physical Review Materials",
year = "2020",
volume = "4",
number = "2",
pages = "e023602",
month = "Feb.",
abstract = "Layered materials can usually grow without strain on top of
distinct substrates if the only interaction between them is due to
van der Waals forces. In such a scenario it would be expected that
the heterointerface made up of weak bounds would not affect the
overlayed material significantly for several large
lattice-mismatched systems. Here we have studied the first stages
of the heteroepitaxial growth of layered bismuth telluride
topological insulator on top of highly oriented pyrolitic graphite
(HOPG) by molecular beam epitaxy. Samples were investigated by
atomic force microscopy (AFM), synchrotron x-ray diffraction
(XRD), and micro-Raman spectroscopy. AFM images show
hexagonal/triangular flat islands with exposed HOPG areas for the
low coverage regime, and the lattice parameter of these Bi2Te3
structures were measured by XRD. The existence of pseudomorphic
strain at the initial Bi2Te3 layers was retrieved by both XRD and
Raman spectroscopy. We have found evidence that Bi2Te3 layers near
the interface are subject to an in-plane compressive strain,
leading to a pseudomorphic out-of-plane lattice expansion.
Furthermore, the presence of Bi2Te3 islands locally distorts the
topmost layer of HOPG, resulting in tensile strain which was
measured by Raman spectroscopy. The observed relaxation of
0.1-0.2% for each van der Waals gap is used to calculate elastic
constants of Bi-2 bilayers, which are crucial building blocks for
the formation of other BixTey topological insulator compounds.
Finally, the impact of such a strain in Bi2Te3 electronic
structure was investigated by density functional theory
calculations. The results show that the band structure of this
strained material remains unchanged at the center of the Brillouin
zone, confirming the robustness of surface states, but it is
consistently affected at the M and K zone edges.",
doi = "10.1103/PhysRevMaterials.4.023602",
url = "http://dx.doi.org/10.1103/PhysRevMaterials.4.023602",
issn = "2475-9953",
language = "en",
targetfile = "PhysRevMaterials_v4_p023602_2020_Bi2Te3-HPOG.pdf",
urlaccessdate = "28 abr. 2024"
}